By Denis Fred Simon, Wei Xie, Liqin Ren, H. J. H. Brouwers
7 pages
Jan. 1, 0001
Books reviewed: Kathleen Walsh, Foreign High-Tech R&D in China: Risks, Rewards and Implications for US-China Relations Review of Leading Chinese Journals Reporting on R&D Management and Innovation G. C. Chow, Knowing China.